Ming Yan (闫 明) 

Publications:

† : refers to the first student author, * : refers to the corresponding author.

13. [TSE'25] Evaluating Spectrum-based Fault Localization on Deep Learning Libraries. (CCF-A)
Ming Yan, Junjie Chen*, Tianjie Jiang, Jiajun Jiang, Zan Wang.
In: IEEE Transactions on Software Engineering, 2025, to appear.

12. [ICSE-SEIP'23] Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations. (CCF-A)
Ming Yan, Junjie Chen*, Hangyu Mao, Jiajun Jiang, Jianye Hao, Xingjian Li, Zhao Tian, Zhichao Chen, Dong Li, Zhangkong Xian, Yanwei Guo, Wulong Liu, Bin Wang, Yuefeng Sun, Yongshun Cui.
In: The 45th International Conference on Software Engineering, SEIP track, May 14-20, 2023, pages to appear, Melbourne Convention and Exhibition Centre, Melbourne, Australia.

11. [FSE'21] Exposing Numerical Bugs in Deep Learning via Gradient Back-propagation. (CCF-A)
Ming Yan, Junjie Chen*, Xiangyu Zhang, Lin Tan, Gan Wang, Zan Wang.
In: The 29th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, August 23-28, 2021, 627-638, Athens, Greece
ACM SIGSOFT Distinguished Paper Award Nominee

10. [FSE'20] Deep Learning Library Testing via Effective Model Generation. (CCF-A)
Zan Wang, Ming Yan†, Junjie Chen*, Shuang Liu, Dongdi Zhang.
In: The 28th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, November 8-13, 2020, 788-799, Sacramento, California, United States
🏆 ACM SIGSOFT Distinguished Paper Award

9. [IST'24] Robustness Evaluation of Code Generation Systems via Concretizing Instructions. (CCF-B)
Ming Yan, Junjie Chen*, Jie M. Zhang, Xuejie Cao, Chen Yang, Mark Harman.
In: Information and Software Technology, 2025, 179: 107645.

8. [JSEP'24] Revisiting Deep Neural Network Test Coverage from the Test Effectiveness Perspective. (CCF-B)
Ming Yan, Junjie Chen*, Xuejie Cao, Zhuo Wu, Yuning Kang, Zan Wang.
In: Journal of Software: Evolution and Process, 2024, 36(4): e2561.

7. [Journal of Software'20] Survey on testing of deep neural networks. (CCF-A类中文)
Zan Wang, Ming Yan†, Shuang Liu*, Junjie Chen, Dongdi Zhang, Zhuo Wu, Xiang Chen.
In: Journal of Software, 2020,31(5):1255−1275 (in Chinese).

6. [Journal of Software'25] CoDefense: Defending Against Adversarial Attacks with Multi-Granularity Code Normalization. (CCF-A类中文)
Zhao Tian, Shiqi Kuang Ming Yan, Haichi Wang, Junjie Chen*.
In: Journal of Software (in Chinese), 2025, to appear.

5. [Journal of Software'25] Survey of Intelligent Chip Design Program Testing. (CCF-A类中文)
Xiaopeng Li, Ming Yan, Xingyu Fan, Zhentao Tang, Shixiong Kai, Jianye Hao, Mingxuan Yuan, Junjie Chen*.
In: Journal of Software (in Chinese), 2025, to appear.

4. [IST'23] Stratified random sampling for neural network test input selection. (CCF-B)
Zhuo Wu, Zan Wang, Junjie Chen, Hanmo You, Ming Yan, Lanjun Wang*.
In: Information and Software Technology, 2024, 165: 107331.

3. [Journal of Software'23] Test Case Selection for Deep Neural Networks via Data Mutation. (CCF-A类中文)
Xuejie Cao, Junjie Chen*, Ming Yan, Hanmo You , Zhuo Wu, Zan Wang.
In: Journal of Software (in Chinese), 2023, to appear.

2. [ASE-NIER'22] An Empirical Study on Numerical Bugs in Deep Learning Programs. (CCF-A Workshop)
Gan Wang, Zan Wang, Junjie Chen*, Xiang Chen, Ming Yan.
In: The 37th IEEE/ACM International Conference on Automated Software Engineering, NIER track, October 10-14, 2022, pages to appear, Oakland Center, Michigan, USA

1. [TOSEM'20] Practical Accuracy Estimation for Efficient Deep Neural Network Testing. (CCF-A)
Junjie Chen, Zhuo Wu, Zan Wang, Hanmo You, Lingming Zhang, Ming Yan.
In: ACM Transactions on Software Engineering and Methodology (TOSEM),2020, 29(4): 1-35., (Selected for ESEC/FSE 2021 Journal-First Presentation)

Academic Services:

Conference Reviewer

• 2025: FSE Program Committee (AI IDE-track)

• 2025: ISSTA  Artifact Evaluation Committee

• 2025: ICSE Artifact Evaluation Committee

• 2024: ISSRE Artifact Evaluation Committee

• 2024: ECOOP Artifact Evaluation Committee

• 2023: ISSTA Artifact Evaluation Committee

Journal Reviewer

• 2025: Automated Software Engineering

• 2025: Information and Software Technology

• 2024: IEEE Transactions on Software Engineering

Co-Reviewer

• 2024: ISSTA co-reviewer

• 2023: ESEC/FSE co-reviewer, ASE co-reviewer, ICSE(2024) co-reviewer

• 2022: ESEC/FSE co-reviewer, ASE co-reviewer

• 2021: ISSTA co-reviewer, TDSC co-reviewer.

• 2020: ISSTA Tool Demo co-reviewer, JCST co-reviewer, COMPSAC co-reviewer, Journal of Software co-reviewer.

Invited Talks:

1. Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations. May. 2023, ICSE 2023 Conference Talk, Melbourne, Australia.

2. Revisiting Deep Neural Network Test Coverage from the Test Effectiveness Perspective. Nov. 2022, ChinaSoft 2022 Conference Talk.

3. Exposing numerical bugs in deep learning via gradient back-propagation. Aug. 2021, ESEC/FSE 2021 Conference Talk.

4. Deep Learning Library Testing via Effective Model Generation. Nov. 2020, ESEC/FSE 2020 Conference Talk.

5. Survey on testing of deep neural networks. Dec. 2019, NASAC 2019 Conference Talk. Hangzhou, China.

Honors & Awards

• 2024: Huawei Scholarship, Huawei

• 2023: Outstanding Ph.D Student Forum, CCF ChinaSoft

• 2023: Huawei: Outstanding Contribution Award, Huawei & Tianjin University

• 2022: CIE Outstanding Master Dissertation Award, Chinese Institute of Electronics

• 2021: Outstanding Graduate Students, Tianjin University (master’s degree)

• 2021: Outstanding Master Dissertation Award, Tianjin University

• 2020: National Scholarship, Ministry of Education

• 2020: Innovation Scholarship, College of Intelligence and Computing, Tianjin University

• 2020: ACM SIGSOFT Distinguished Paper Award

• 2018: Outstanding Graduate Students, Tianjin University (bachelor’s degree)

Last Updated: 2025.04