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Ming Yan (闫 明) 

I am Ming Yan, a SE Ph.D. candidate at College of Intelligence and Computing, Tianjin University, supervised by Prof. Junjie Chen. I received my master’s degree in 2021 and bachelor’s degree in 2018 both from Tianjin University supervised by Prof. Zan Wang. My research interests lie primarily in DL system quality assurance and software testing.

Email: yanming[at]tju[DOT]edu[DOT]cn

Address: Building #55, College of Intelligence and Computing, Tianjin University Beiyangyuan Campus, No. 135 Yaguan Road, Jinnan District, Tianjin, 300350 

Publications:

† : refers to the first student author, * : refers to the corresponding author.

13. [TSE'25] Evaluating Spectrum-based Fault Localization on Deep Learning Libraries. (CCF-A)
Ming Yan, Junjie Chen*, Tianjie Jiang, Jiajun Jiang, Zan Wang.
In: IEEE Transactions on Software Engineering, 2025, to appear.

12. [ICSE-SEIP'23] Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations. (CCF-A)
Ming Yan, Junjie Chen*, Hangyu Mao, Jiajun Jiang, Jianye Hao, Xingjian Li, Zhao Tian, Zhichao Chen, Dong Li, Zhangkong Xian, Yanwei Guo, Wulong Liu, Bin Wang, Yuefeng Sun, Yongshun Cui.
In: The 45th International Conference on Software Engineering, SEIP track, May 14-20, 2023, pages to appear, Melbourne Convention and Exhibition Centre, Melbourne, Australia.

11. [FSE'21] Exposing Numerical Bugs in Deep Learning via Gradient Back-propagation. (CCF-A)
Ming Yan, Junjie Chen*, Xiangyu Zhang, Lin Tan, Gan Wang, Zan Wang.
In: The 29th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, August 23-28, 2021, 627-638, Athens, Greece
ACM SIGSOFT Distinguished Paper Award Nominee

10. [FSE'20] Deep Learning Library Testing via Effective Model Generation. (CCF-A)
Zan Wang, Ming Yan†, Junjie Chen*, Shuang Liu, Dongdi Zhang.
In: The 28th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, November 8-13, 2020, 788-799, Sacramento, California, United States
🏆 ACM SIGSOFT Distinguished Paper Award

9. [IST'24] Robustness Evaluation of Code Generation Systems via Concretizing Instructions. (CCF-B)
Ming Yan, Junjie Chen*, Jie M. Zhang, Xuejie Cao, Chen Yang, Mark Harman.
In: Information and Software Technology, 2025, 179: 107645.

8. [JSEP'24] Revisiting Deep Neural Network Test Coverage from the Test Effectiveness Perspective. (CCF-B)
Ming Yan, Junjie Chen*, Xuejie Cao, Zhuo Wu, Yuning Kang, Zan Wang.
In: Journal of Software: Evolution and Process, 2024, 36(4): e2561.

7. [Journal of Software'20] Survey on testing of deep neural networks. (CCF-A类中文)
Zan Wang, Ming Yan†, Shuang Liu*, Junjie Chen, Dongdi Zhang, Zhuo Wu, Xiang Chen.
In: Journal of Software, 2020,31(5):1255−1275 (in Chinese).

6. [Journal of Software'25] CoDefense: Defending Against Adversarial Attacks with Multi-Granularity Code Normalization. (CCF-A类中文)
Zhao Tian, Shiqi Kuang Ming Yan, Haichi Wang, Junjie Chen*.
In: Journal of Software (in Chinese), 2025, to appear.

5. [Journal of Software'25] Survey of Intelligent Chip Design Program Testing. (CCF-A类中文)
Xiaopeng Li, Ming Yan, Xingyu Fan, Zhentao Tang, Shixiong Kai, Jianye Hao, Mingxuan Yuan, Junjie Chen*.
In: Journal of Software (in Chinese), 2025, to appear.

4. [IST'23] Stratified random sampling for neural network test input selection. (CCF-B)
Zhuo Wu, Zan Wang, Junjie Chen, Hanmo You, Ming Yan, Lanjun Wang*.
In: Information and Software Technology, 2024, 165: 107331.

3. [Journal of Software'23] Test Case Selection for Deep Neural Networks via Data Mutation. (CCF-A类中文)
Xuejie Cao, Junjie Chen*, Ming Yan, Hanmo You , Zhuo Wu, Zan Wang.
In: Journal of Software (in Chinese), 2023, to appear.

2. [ASE-NIER'22] An Empirical Study on Numerical Bugs in Deep Learning Programs. (CCF-A Workshop)
Gan Wang, Zan Wang, Junjie Chen*, Xiang Chen, Ming Yan.
In: The 37th IEEE/ACM International Conference on Automated Software Engineering, NIER track, October 10-14, 2022, pages to appear, Oakland Center, Michigan, USA

1. [TOSEM'20] Practical Accuracy Estimation for Efficient Deep Neural Network Testing. (CCF-A)
Junjie Chen, Zhuo Wu, Zan Wang, Hanmo You, Lingming Zhang, Ming Yan.
In: ACM Transactions on Software Engineering and Methodology (TOSEM),2020, 29(4): 1-35., (Selected for ESEC/FSE 2021 Journal-First Presentation)

Academic Services:

Conference Reviewer

Journal Reviewer

Co-Reviewer

Invited Talks:

1. Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations. May. 2023, ICSE 2023 Conference Talk, Melbourne, Australia.

2. Revisiting Deep Neural Network Test Coverage from the Test Effectiveness Perspective. Nov. 2022, ChinaSoft 2022 Conference Talk.

3. Exposing numerical bugs in deep learning via gradient back-propagation. Aug. 2021, ESEC/FSE 2021 Conference Talk.

4. Deep Learning Library Testing via Effective Model Generation. Nov. 2020, ESEC/FSE 2020 Conference Talk.

5. Survey on testing of deep neural networks. Dec. 2019, NASAC 2019 Conference Talk. Hangzhou, China.

Honors & Awards


Last Updated: 2025.03